مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2633995

Title :

Test Technology Technical Council (TTTC)

fYear :

2007

fDate :

39203

Keywords :

Art; Conferences; Electronic equipment testing; Logic design; Logic testing; Meetings; System testing; Technical Councils; Technical activities; USA Councils;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium, 2007. 25th IEEE

Conference_Location :

Berkeley, CA, USA

ISSN :

1093-0167

Print_ISBN :

0-7695-2812-0

Type :

conf

DOI :

10.1109/VTS.2007.81

Filename :

4209880

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2633995