Abstract :
This special session will discuss some fundamental testing issues in analog and mixed signal circuits and present some innovative techniques to make analog/mixed signal (MS) test coverage evaluation as robust as digital. Unlike digital circuits, there is no effective methodology today to deterministically predict analog/MS test coverage in order to help minimizing system level fallouts. This ¿hot topic¿ discussion will start with addressing fundamental problems related to analog and mixed signal testing and barriers in evaluating analog test quality in a cost effective way. Some traditional and innovative DFT techniques will be presented and their pros and cons will be described. A new analog and mixed signal ¿deterministic¿ fault modeling technique will be presented to target at a ¿repeatable¿ and automatic analog test coverage evaluation to guide a structural analog DFT approach.
