Title :
Laser optical in-circuit measurement system for immunity applications
Author :
Ding, Chong ; Pommerenke, David
Author_Institution :
University of Missouri-Rolla
Keywords :
Circuit testing; Fiber lasers; Immunity testing; Optical fiber cables; Optical interferometry; Optical modulation; Optical receivers; Optical sensors; Probes; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706373