DocumentCode :
2636380
Title :
Defect tolerance scheme for gigaFLOP WSI architectures
Author :
Singh, Adit D. ; Youn, Hee Yong
Author_Institution :
Dept. of ECE, Massachusetts Univ., Amherst, MA, USA
fYear :
1990
fDate :
23-25 Jan 1990
Firstpage :
109
Lastpage :
115
Abstract :
Performance is the one area in which a monolithic technology has potential unmatched by other approaches. Integrating an entire high performance system on a single piece of silicon eliminates the off-chip signal delays encountered in multichip implementations, which can become the performance bottleneck in highly pipelined array architectures. The major problem with achieving full wafer integration is that it is virtually impossible to realize such large area circuits entirely defect free. The authors present a scheme which can reconfigure the rectangular array using channel width of 2, while allowing short maximum restructured edge length. The yield of desired array in their design is much higher than that of other designs with same degree of redundancy
Keywords :
MOS integrated circuits; VLSI; cellular arrays; fault tolerant computing; parallel architectures; pipeline processing; redundancy; channel width; entire high performance system; full wafer integration; gigaFLOP WSI architectures; highly pipelined array architectures; rectangular array; redundancy; short maximum restructured edge length; wafer scale integration WSI; yield; Clocks; Computer architecture; Computer science; Costs; Delay; Integrated circuit interconnections; Packaging; Pipeline processing; Silicon; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9013-5
Type :
conf
DOI :
10.1109/ICWSI.1990.63890
Filename :
63890
Link To Document :
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