DocumentCode :
2636778
Title :
Modeling and measurement of radiated emission through a cutout on the power/ground pl
Author :
Lee, Junwoo ; Kang, Jongho ; Park, Kunwoo ; Kim, Joungho
Author_Institution :
Hynix Semiconductor Inc.
Volume :
3
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
776
Lastpage :
780
Keywords :
Analytical models; Circuit noise; Circuit simulation; Eigenvalues and eigenfunctions; Integrated circuit interconnections; Magnetic noise; Power measurement; Printed circuits; Semiconductor device noise; Semiconductor device packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706415
Filename :
1706415
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2636778
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