Title :
Integrated state test system of high voltage circuit breakers based on embedded technology
Author :
Fan, Yang ; Chenxi, Qiao ; Xiaohui, Zhang ; Jun, Dong ; Yujie, Pei ; Xiaoguang, Hu
Author_Institution :
Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
Abstract :
It is especially necessary to monitor the operation state of high voltage circuit breakers to ensure the smooth and safe running of power system. This paper presents the construction and principle of a designed system for diagnostic testing of high voltage circuit breakers. The test system is based on the architecture of ARM as processor and embedded LINUX as operating system. Modular design of the hardware platform is proposed. And the hardware platform consists of ARM core board, signal collection module, A/D sample module and result display module. To develop applications, the ARM is transplanted with Qt/Embedded. And the discrete-time Mallet wavelet transform algorithm is used to process coil current signal. This test system has the feature of high reliability, flexible configuration and many characteristic parameters of high voltage circuit breakers can be obtained through it.
Keywords :
Linux; analogue-digital conversion; circuit breakers; microprocessor chips; reliability; wavelet transforms; A/D sample module; ARM core board; ARM processor; diagnostic testing; discrete-time Mallet wavelet transform; embedded LINUX operating system; embedded technology; high voltage circuit breakers; integrated state test system; power system; reliability; signal collection module; Circuit breakers; Coils; Driver circuits; Hardware; Linux; Maintenance engineering; Operating systems; ARM; LINUX; Qt/Embedded; discrete-time Mallet wavelet; high voltage circuit breaker;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8754-7
Electronic_ISBN :
pending
DOI :
10.1109/ICIEA.2011.5975847