Title :
ATE evolution: How we slew the ATE giant
Author :
Esquivel, Eloy C PE ; Ramirez, Luis F. ; Valchar, Larry L.
Author_Institution :
Electron. ATE Software Support Section, Kelly AFB, TX, USA
Abstract :
TISTE has been developing Test Program Sets (TPSs) for Shop Replaceable Units (SRUs) to be used in repair depot since the mid seventies. Since that time, the business has evolved from using speciality testers to using large multipurpose testers to the present use of several small testers. This paper discusses how and why the small tester concept was implemented and how it has worked in the Electronic ATE Software Support Section
Keywords :
automatic test equipment; automatic test software; maintenance engineering; microcomputer applications; military avionics; ATE; Air Force; Fluke; GenRad; MATE; Schlumberger; Shop Replaceable Units; TISTE; TRU; Test Program Sets; repair depot; small tester concept; software support; Automatic test equipment; Circuit testing; Electronic equipment testing; Instruments; Power supplies; Programming; Radio frequency; Software testing; System testing; Test equipment;
Conference_Titel :
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-0646-5
DOI :
10.1109/AUTEST.1993.396335
