Title :
Remote Testing and Diagnosis of System-on-Chips Using Network Management Frameworks
Author :
Laouamri, Oussama ; Aktouf, Chouki
Author_Institution :
DeFacTo Technol., Moirans
Abstract :
This paper presents a new approach that allows remote testing and diagnosis of complex (systems-on-chip) and embedded IP cores. The approach extends both on-chip design-for-test (DFT) architectures and network management protocols to take full benefits from existing networking infrastructures. By running intensive experimentation on ITC´99 and ITC´02 design benchmarks, the efficiency of the proposed testing and diagnosis methodology is analyzed
Keywords :
automatic test equipment; computer network management; design for testability; fault diagnosis; integrated circuit testing; system-on-chip; embedded IP cores; network management protocols; on-chip design-for-test; remote diagnosis; remote testing; system-on-chips; Computer network management; Costs; Design for testability; Electronic equipment testing; Life testing; Power system management; Protocols; System testing; System-on-a-chip; TCPIP;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
DOI :
10.1109/DATE.2007.364620
