Title :
Low voltage electrostatic actuation and angular displacement measurement of micromirror coupled with resonant drive circuit
Author :
Park, Sangtak ; Pallapa, Manu ; Yeow, John T W ; Abdel-Rahman, Eihab
Author_Institution :
Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
A micromirror driven by electrostatic actuation methods requires high actuation voltage supplied by a high voltage amplifier and suffers from the pull-in phenomenon that limits an operation range of a micromirror to 44 % of its maximum angular displacement. To provide practical solutions to this high actuation voltage and a limited operation range, we present complete analytical and numerical models of a micromirror coupled with resonant drive circuits that enable us to actuate a micromirror at much lower supply voltage than that of conventional voltage control circuits. The presented work also facilitates the stability analysis of a micromirror coupled with a resonant drive circuit and provides how a parasitic capacitance of a micromirror and a quality factor of a resonant drive circuit affect an operation range of a micromirror. Furthermore, we present a new method of an angular displacement measurement of a micromirror by sensing the phase delay of an actuation voltage with reference to an input voltage.
Keywords :
Q-factor; angular measurement; capacitance; delays; displacement measurement; electrostatic actuators; finite element analysis; integrated optoelectronics; micro-optomechanical devices; micromirrors; analytical model; coupled micromirror; high actuation voltage; high voltage amplifier; low voltage electrostatic actuation; lower supply voltage; maximum angular displacement measurement; numerical model; parasitic capacitance; phase delay sensing; pull-in phenomenon; quality factor; resonant drive circuit; stability analysis; Displacement measurement; Phase measurement; Angular Displacement Measurement; Electrostatic Actuation; Micromirror; Phase Delay; Resonant Drive Circuit;
Conference_Titel :
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-2419-9
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2012.6389255