• DocumentCode
    2641271
  • Title

    Low voltage electrostatic actuation and angular displacement measurement of micromirror coupled with resonant drive circuit

  • Author

    Park, Sangtak ; Pallapa, Manu ; Yeow, John T W ; Abdel-Rahman, Eihab

  • Author_Institution
    Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2012
  • fDate
    25-28 Oct. 2012
  • Firstpage
    3976
  • Lastpage
    3981
  • Abstract
    A micromirror driven by electrostatic actuation methods requires high actuation voltage supplied by a high voltage amplifier and suffers from the pull-in phenomenon that limits an operation range of a micromirror to 44 % of its maximum angular displacement. To provide practical solutions to this high actuation voltage and a limited operation range, we present complete analytical and numerical models of a micromirror coupled with resonant drive circuits that enable us to actuate a micromirror at much lower supply voltage than that of conventional voltage control circuits. The presented work also facilitates the stability analysis of a micromirror coupled with a resonant drive circuit and provides how a parasitic capacitance of a micromirror and a quality factor of a resonant drive circuit affect an operation range of a micromirror. Furthermore, we present a new method of an angular displacement measurement of a micromirror by sensing the phase delay of an actuation voltage with reference to an input voltage.
  • Keywords
    Q-factor; angular measurement; capacitance; delays; displacement measurement; electrostatic actuators; finite element analysis; integrated optoelectronics; micro-optomechanical devices; micromirrors; analytical model; coupled micromirror; high actuation voltage; high voltage amplifier; low voltage electrostatic actuation; lower supply voltage; maximum angular displacement measurement; numerical model; parasitic capacitance; phase delay sensing; pull-in phenomenon; quality factor; resonant drive circuit; stability analysis; Displacement measurement; Phase measurement; Angular Displacement Measurement; Electrostatic Actuation; Micromirror; Phase Delay; Resonant Drive Circuit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Montreal, QC
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4673-2419-9
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2012.6389255
  • Filename
    6389255