Title :
Automatic Generation of Functional Coverage Models from Behavioral Verilog Descriptions
Author :
Verma, Shireesh ; Harris, Ian G. ; Ramineni, Kiran
Author_Institution :
Dept. of Comput. Sci., California Irvine Univ., CA
Abstract :
As an industrial practice, the functional coverage models are developed based on a high-level specification of the design under verification (DUV). However, in the course of implementation a designer makes specific choices which may not be reflected well in a functional coverage model developed entirely from a high-level specification. We present a method to automatically generate implementation-aware coverage models based on the static analysis of a HDL description of the DUV. Experimental results show that the functional coverage models generated using our technique correlate well with the detection of randomly injected errors into a design
Keywords :
automatic test pattern generation; formal specification; hardware description languages; high level synthesis; HDL description; Verilog descriptions; automatic generation; design under verification; functional coverage models; high-level specification; static analysis; Hardware design languages;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
DOI :
10.1109/DATE.2007.364407