• DocumentCode
    2642633
  • Title

    Automatic Generation of Functional Coverage Models from Behavioral Verilog Descriptions

  • Author

    Verma, Shireesh ; Harris, Ian G. ; Ramineni, Kiran

  • Author_Institution
    Dept. of Comput. Sci., California Irvine Univ., CA
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    As an industrial practice, the functional coverage models are developed based on a high-level specification of the design under verification (DUV). However, in the course of implementation a designer makes specific choices which may not be reflected well in a functional coverage model developed entirely from a high-level specification. We present a method to automatically generate implementation-aware coverage models based on the static analysis of a HDL description of the DUV. Experimental results show that the functional coverage models generated using our technique correlate well with the detection of randomly injected errors into a design
  • Keywords
    automatic test pattern generation; formal specification; hardware description languages; high level synthesis; HDL description; Verilog descriptions; automatic generation; design under verification; functional coverage models; high-level specification; static analysis; Hardware design languages;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364407
  • Filename
    4211917