Title :
Corrosion Resistance of Low Coercivity, High Moment FeXN (X=Rh, Mo) Thin Film Head Materials
Author :
Nguyentran, L. ; Kyusik Sin ; Jongill Hong ; Pizzo, P.P. ; Shan X.Wang
Author_Institution :
Stanford University
Keywords :
Argon; Circuit testing; Coercive force; Corrosion; Electric resistance; Iron; Magnetic films; Magnetic heads; Polarization; Transistors;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597613
