DocumentCode
2643801
Title
[Title page i]
fYear
2010
fDate
13-15 Dec. 2010
Abstract
The following topics are dealt with: microprocessor test and verification; automated debugging; SoC testing; schedulability analysis; model checking; system-on-chip reliability; functional stress pattern generation; fault grading; software-based self-test program; hardware-software codesign; abstract state machines; electronic design logic simulation; and graphics processing units.
Keywords
automatic test software; built-in self test; computer debugging; computer graphic equipment; coprocessors; fault diagnosis; finite state machines; formal verification; hardware-software codesign; integrated circuit reliability; logic design; logic simulation; logic testing; processor scheduling; system-on-chip; SoC testing; abstract state machines; automated debugging; electronic design logic simulation; fault grading; functional stress pattern generation; graphics processing units; hardware-software codesign; microprocessor test; microprocessor verification; model checking; schedulability analysis; software-based self-test program; system-on-chip reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocessor Test and Verification (MTV), 2010 11th International Workshop on
Conference_Location
Austin, TX
ISSN
1550-409
Print_ISBN
978-1-61284-287-5
Type
conf
DOI
10.1109/MTV.2010.1
Filename
5976199
Link To Document