Title :
Automatic Load Contour Mapping for Microwave Power Transistors
Author :
Cusack, J. ; Perlow, S. ; Perlman, B.
Abstract :
A technique for large signal characterization of microwave power transistors is described. A computer controlled apparatus is used to map contours of constant output power and efficiency, on a Smith Chart, for dynamic matching of both input and output circuits.
Keywords :
Circuits; Frequency; Impedance matching; Laboratories; Microwave theory and techniques; Power generation; Power transistors; Signal design; Tuners; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1974 S-MTT International
Conference_Location :
Atlanta, Georgia, USA
DOI :
10.1109/MWSYM.1974.1123569
