DocumentCode :
2643816
Title :
The Effect Of MR Head Nonlinearity On MDFE And PRML Performance
Author :
Bin Liu ; Yuan Xing Lee ; Mutoh, H.
Author_Institution :
Data Storage Institute, National University of Singapore
fYear :
1997
fDate :
1-4 April 1997
Keywords :
AWGN; Additive white noise; Cutoff frequency; Degradation; Detectors; Equalizers; Gaussian noise; Polynomials; Signal to noise ratio; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597620
Filename :
597620
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2643816
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