DocumentCode :
2643953
Title :
Self Heating-Aware Optimal Wire Sizing under Elmore Delay Model
Author :
Ni, Min ; Memik, Seda Ogrenci
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL
fYear :
2007
fDate :
16-20 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
Global interconnect temperature keeps rising in the current and future technologies due to self-heating and the adiabatic property of top metal layers. The thermal effects impact adversely both reliability and performance of the interconnect wire, shortening the interconnect lifetime and increasing the interconnect delay. Such effects must be considered during the process of interconnect design. In this paper, one important argument is that the traditional linear dependence between wire resistance and wire width is no longer adequate for high layer interconnects due to the adiabatic property of these wires. By using curve fitting technique, we propose a quadratic model to represent the resistance of interconnect, which is aware of the thermal effects. Based on this model and the Elmore delay model, we derived a linear optimal wire sizing formula in form of f(x) = ax + b. Compared to non-thermal-aware exponential wire sizing formula inform of f(x) = ae -bx, we observed a 49.7% average delay gain with different choices of physical parameters
Keywords :
curve fitting; delays; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; Elmore delay model; adiabatic property; curve fitting; global interconnect temperature; interconnect delay; interconnect design; interconnect lifetime; interconnect resistance; linear optimal wire sizing; quadratic model; self-heating-aware optimal wire sizing; thermal effects; Conducting materials; Delay; Dielectric materials; Electrical capacitance tomography; Heat sinks; Performance analysis; Temperature; Thermal conductivity; Thermal resistance; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
Type :
conf
DOI :
10.1109/DATE.2007.364489
Filename :
4211999
Link To Document :
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