Title :
On the measurement of effective propagation time constant for a copper-clad laminate
Author :
Agrawal, Amit P. ; Chang, Chi Shih ; Gernhart, Debra A.
Author_Institution :
Systems Technology Division, IBM, Endicott, NY 13760
Keywords :
Copper; Dielectric constant; Dielectric measurements; Equations; Laminates; Resonant frequency; Rough surfaces; Surface impedance; Surface roughness; Time measurement;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1992
Print_ISBN :
0-7803-0683-X
DOI :
10.1109/EPEP.1992.572279