Title :
Diode laser-induced fluorescence velocimetry of clustered hall thruster plumes
Author :
Ngom, Bailo B. ; Smith, Timothy B. ; Gallimore, Alec D.
Author_Institution :
Michigan Univ., Ann Arbor, MI
Abstract :
Summary form only given. We present laser-induced fluorescence (LIF) measurements of singly-ionized xenon (5d 2F7/2) in the plume of a cluster of four 600-Watt (BHT-600) Hall thrusters. Two 834.7 nm beams from a TUI Optics TA-100/830 tapered-amplifier diode laser are focused on orthogonal optical axes onto a submillimeter interrogation volume, from which we collect LIF at 541.9 nm. Since high ion velocities produce large Doppler shifts (50 GHz), we use repeatable frequency markings from a 2-GHz confocal etalon to patch together extended scans from several mode-hop-free segments (each 10-GHz). Isotopic shifts and lower-state (5d 2F7/2) nuclear-spin constants estimated from optogalvanic spectra permit Fourier-transform deconvolution of ion velocity estimates from LIF spectra along the axial and radial beam directions. Transformation of deconvolved velocity distributions to energy space permits comparison of far-field LIF to two-dimensional energy distributions measured with a top-hat electrostatic analyzer (TOPAZ)
Keywords :
Doppler shift; laser velocimetry; optogalvanic spectroscopy; plasma accelerators; plasma diagnostics; plasma light propagation; plasma magnetohydrodynamics; plasma transport processes; xenon; 50 GHz; 541.9 nm; 600 W; 834.7 nm; Doppler shifts; Fourier-transform deconvolution; Hall thruster plumes; TUI Optics TA-100/830 tapered-amplifier diode laser; Xe; confocal etalon; diode laser-induced fluorescence velocimetry; energy distributions; energy space; ion velocities; isotopic shifts; nuclear-spin constants; optogalvanic spectra; orthogonal optical axes; singly-ionized xenon; submillimeter interrogation volume; top-hat electrostatic analyzer; Deconvolution; Diode lasers; Doppler shift; Electrostatic measurements; Extraterrestrial measurements; Fluorescence; Frequency; Laser beams; Particle beam optics; Xenon;
Conference_Titel :
Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
Conference_Location :
Traverse City, MI
Print_ISBN :
1-4244-0125-9
DOI :
10.1109/PLASMA.2006.1706996