Title :
A fully digital controlled off-chip IDDQ measurement unit
Author :
Straka, B. ; Manhaeve, H. ; Vanneuville, J. ; Svajda, M.
Author_Institution :
CEDO, Brno, Czech Republic
Abstract :
The paper describes a new Digital controlled Off-Chip IDDQ Measurement Unit (DOCIMU), which provides reliable precision and relatively fast measurements, even with a high capacitive load, while the Device Under Test (DUT) is unaffected. The maximal resolution is 50 nA and the accurate measurement range is 1 mA. Unlike other IDDQ monitors, the DOCIMU copes with external interference, as it needs no analogue pin to set the IDDQ limit and the noise at the VDD is eliminated via a special S/H feature. The DOCIMU is also a testable IDDQ monitor, which is another unique feature
Keywords :
CMOS integrated circuits; automatic test equipment; computerised monitoring; digital instrumentation; electric current measurement; electromagnetic interference; integrated circuit testing; interference suppression; 1 mA; 50 nA; ATE; CMOS IC testing; EMI immunity; S/H feature; digitally-controlled measurement unit; external interference; high capacitive load; off-chip IDDQ measurement unit; sample/hold feature; testable IDDQ monitor; Digital control; Measurement units;
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
DOI :
10.1109/DATE.1998.655904
