Title :
Microsystems testing: an approach and open problems
Author :
Lubaszewski, Marcelo ; Cota, Erika F. ; Courtois, B.
Author_Institution :
DELET/UFRGS, Porto Alegre, Brazil
Abstract :
In this work a Computer-Aided Testing (CAT) tool is proposed that brings a systematic way of dealing with testing problems in emerging microsystems. Experiments with case-studies illustrate the techniques and tools embedded in the CAT environment. Some of the open problems that shall be addressed in the near future as an extension to this work are also discussed
Keywords :
automatic testing; built-in self test; design for testability; fault diagnosis; integrated circuit testing; micromechanical devices; BIST; DFT; computer-aided testing tool; fault modelling; fault simulation; microsystems testing; test generation; Circuit faults; Circuit testing; Computational modeling; Context modeling; Detectors; Electrical fault detection; Electronic equipment testing; Fault detection; Signal design; System testing;
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
DOI :
10.1109/DATE.1998.655908
