• DocumentCode
    2646864
  • Title

    Power flow modeling for RITS-6

  • Author

    Bruner, Nichelle ; Genoni, Tom ; Rose, David ; Welch, Dale ; Johnson, David ; Oliver, Bryan

  • Author_Institution
    Voss Sci., LLC, Albuquerque, NM
  • fYear
    2006
  • fDate
    4-8 June 2006
  • Firstpage
    161
  • Lastpage
    161
  • Abstract
    Summary form only given. Sandia National Laboratories began commissioning the six-stage inductive voltage adder (IVA) configuration of its Radiographic Integrated Test Stand (RITS-6) in 2006. The lower impedance IVA technology results in excess power-flow from the transmission line to the diode region. Schemes to divert the excess flow include attaching a large-radius field shaper ("knob") to the transmission line immediately upstream from the diode region with a correspondingly larger anode radius ("dustbin"). The RITS-6 commissioning includes a series of shots with a blade-diode load for configurations with and without the dustbin and knob. Numerical modeling of each configuration was conducted prior to commissioning using the particle-in-cell code LSP. Modeling included power flow from the transmission line to a blade-diode load with load impedances ranging from under- to over-matched. Simulation results for transmission line currents and impedances for each blade-diode configuration are presented. These results identified geometries which result in cavity resonances and undesirable voltage fluctuations. Efforts to understand and mitigate these resonances are discussed
  • Keywords
    diodes; impedance matching; power transmission lines; pulsed power supplies; LSP; RITS-6; Radiographic Integrated Test Stand; blade-diode load; cavity resonances; field shaper; inductive voltage adder; load impedances; particle-in-cell code; power flow modeling; transmission line; voltage fluctuations; Diodes; Impedance; Joining processes; Laboratories; Load flow; Power transmission lines; Radiography; Resonance; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
  • Conference_Location
    Traverse City, MI
  • Print_ISBN
    1-4244-0125-9
  • Type

    conf

  • DOI
    10.1109/PLASMA.2006.1707033
  • Filename
    1707033