Title :
Hierarchical SoC testing scheduling based on the ant colony algorithm
Author :
Cui, Xiaole ; Cheng, Wei ; Wang, Xiaoye ; Yin, Liang ; Sun, Yachun ; Zhou, Yan
Author_Institution :
Shenzhen Grad. Sch., Key Lab. of Integrated Micorsystems, Peking Univ., Shenzhen, China
Abstract :
SoC testing scheduling is an NP hard problem, and it is more complex for the hierarchical SoC architecture. By formulating the SoC testing scheduling problem as a 2-D bin-packing model, this paper solves the problem for the hierarchical SoC with the ant colony optimization (ACO) algorithm to reduce testing application time. Experimental results on ITC´02 benchmark circuits show that the ACO algorithm is more effective than earlier proposed methods.
Keywords :
circuit testing; optimisation; system-on-chip; 2D bin-packing model; NP hard problem; ant colony algorithm; hierarchical SoC testing scheduling; Ant colony optimization; Circuit testing; Design for testability; Design optimization; Genetic algorithms; Job shop scheduling; NP-hard problem; Scheduling algorithm; Simulated annealing; Sun; Ant Colony Optimization; Hierarchical SoC; Testing scheduling;
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
DOI :
10.1109/ASICON.2009.5351198