Title :
A study on the lifetime comparison for Electric Double Layer Capacitors using Accelerated Degradation Test
Author :
Hwang, Dong-Hoon ; Park, Jung-Won ; Jung, Jae-Han
Author_Institution :
Reliability Technol. Center, Korea Testing Lab. (KTL), Ansan, South Korea
Abstract :
In this paper, we carried out the lifetime comparison for the products (rated voltage: 2.5V and 2.7V, capacitance: 100F) of 8 Electric Double Layer Capacitors (EDLC) makers using Accelerated Degradation Test (ADT) that is commonly used to predict lifetime of the components caused the degradation failure as time passed. ADT was carried out at the various accelerated test conditions (50°C, 60°C, 70°C with constant floating voltage and rapid charge/discharge cycle). As a result of the ADT, we obtained degradation data at each test condition and developed the acceleration model using the degradation data. And then we estimated the lifetime (B10 life and MTTF) of the EDLC at normal usage conditions using the developed acceleration model and compared the products lifetime of 8 makers.
Keywords :
electron device testing; life testing; supercapacitors; accelerated degradation test; capacitance 100 F; charge-discharge cycle; constant floating voltage; degradation failure; electric double layer capacitors; lifetime comparison; temperature 50 degC; temperature 60 degC; temperature 70 degC; voltage 2.5 V; voltage 2.7 V; Capacitance; Companies; Data models; Degradation; Life estimation; Mathematical model; Resistance; accelerated degradation test(ADT); accelerated model; electric double layer capacitors(EDLC); failure mode and mechanism; lifetime;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4577-1229-6
DOI :
10.1109/ICQR2MSE.2011.5976617