• DocumentCode
    2649904
  • Title

    A dynamic model for the state assignment problem

  • Author

    Martínez, M. ; Avedillo, M.J. ; Quintana, J.M. ; Huertas, J.L.

  • Author_Institution
    Inst. de Microelectron., Seville Univ., Spain
  • fYear
    1998
  • fDate
    23-26 Feb 1998
  • Firstpage
    835
  • Lastpage
    839
  • Abstract
    Traditionally, state assignment algorithms follow the two-step strategy of first constraint generation and secondly constraint-guided encoding. There are well known drawbacks in both currently used models for constraint generation. Approaches following the input model generate face constraints without taking into account the sharing of logic among next state lines. Approaches following the input-output model generate face constraints for a priori determined set of dominance/disjunctive relations among the codes of the states which may not hold in final encoding. To overcome these limitations, we propose a dynamic input model which implements both the above cited steps concurrently. The dynamic constraints are of the face type but they are generated during the encoding process and so take advantage of actual relations among partial codes. A general algorithm based on this model and which can target two-level as well as multiple-level implementations is described. Results obtained with the algorithm on the IWLS´93 machines are shown and they compare favorably with standard tools
  • Keywords
    finite state machines; integrated logic circuits; logic CAD; multivalued logic circuits; sequential circuits; state assignment; IWLS´93 machines; constraint generation; constraint-guided encoding; dominance/disjunctive relations; dynamic model; face constraints; multiple-level implementations; partial codes; state assignment problem; two-step strategy; Algorithm design and analysis; Automata; Binary codes; Design optimization; Electronic mail; Encoding; Integrated circuit synthesis; Logic circuits; Logic design; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 1998., Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-8359-7
  • Type

    conf

  • DOI
    10.1109/DATE.1998.655955
  • Filename
    655955