Title :
Using sinusoidal stimuli and Fourier analyses for memory IC testing
Author_Institution :
Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
Abstract :
This paper explores the utilization of sinusoidal stimuli and Fourier analyses to test static RAM integrated circuits. Two different tests are investigated, a writing test with a sinusoidal stimulus on the DATA line and a reading test with a sinusoidal stimulus on an address line. Up to now, results show that numerous types of faults and defects can be detected and even identified. Sensitivity of the method with respect to parameter variations is also investigated
Keywords :
Fourier analysis; SRAM chips; fast Fourier transforms; fault diagnosis; integrated circuit testing; Fourier analyses; SRAM testing; defects detection; fault detection; memory IC testing; parameter variations sensitivity; reading test; sinusoidal stimuli; static RAM integrated circuits; writing test; Circuit faults; Circuit testing; Electrical fault detection; Failure analysis; Fault detection; Integrated circuit testing; Random access memory; Read-write memory; Steady-state; Writing;
Conference_Titel :
Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-6245-X
DOI :
10.1109/MTDT.1994.397191
