Title :
Proceedings of IEEE International Workshop on Memory Technology, Design, and Test
Abstract :
The following topics were dealt with: design for testability; physical defects and failure analysis; innovative designs; fault modeling; automatic test generation; built-in self-test; radiation hardening issues
Keywords :
automatic testing; built-in self test; design for testability; failure analysis; fault diagnosis; integrated circuit design; integrated circuit testing; integrated memory circuits; memory architecture; radiation hardening (electronics); DRAM; RAM; SRAM; automatic test generation; built-in self-test; cache memory; content addressable memories; design for testability; failure analysis; fault modeling; innovative designs; memory design; memory technology; memory testing; physical defects; radiation hardening;
Conference_Titel :
Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-6245-X
DOI :
10.1109/MTDT.1994.397207
