Title :
An EMF activity tree based BPEL defect pattern testing method
Author :
Huang, Junfei ; Gong, Yunzhan
Author_Institution :
State Key Lab. of Networking & Switching Technol., Beijing Univ. of Posts & Telecommun., Beijing, China
Abstract :
For testing BPEL defects efficiently, a novel BPEL defect pattern testing architecture based on the EMF activity tree technology is proposed. The EMF activity tree that is similar to abstract syntax tree is used to describe the BPEL service process structure. The mapping method from the DOM object tree of a BPEL file to the EMF activity tree and the recursive algorithm to generate an EMF activity tree are represented in detail. A typical EMF activity tree is shown and the visitor design pattern based traversal method is stated. The directions to enhance this technology are illustrated finally.
Keywords :
program testing; specification languages; tree data structures; BPEL defect pattern testing method; BPEL service process structure; DOM object tree; EMF activity tree; Eclipse modeling framework; abstract syntax tree; business process execution language; recursive algorithm; traversal method; visitor design pattern; Business; Java; Laboratories; Object oriented modeling; Telecommunication switching; Test pattern generators; Testing; Tree graphs; Unified modeling language; XML; BPEL; EMF activity tree; defect pattern;
Conference_Titel :
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6347-3
DOI :
10.1109/ICCET.2010.5485536
