DocumentCode :
2651962
Title :
A built-in self-test high-current LED driver
Author :
Nguyen, Do Hung ; Hasan, Jaber ; Ang, Simon S.
Author_Institution :
Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
fYear :
2009
fDate :
20-23 Oct. 2009
Firstpage :
340
Lastpage :
343
Abstract :
In this paper, a built-in self-test (BIST) high-current light-emitting-diode (LED) driver circuit is proposed. The circuit not only maintains different constant currents for multiple LED strings, but it also minimizes the conduction power dissipation by keeping the power MOSFETs in the constant-current controllers operating in the linear region. The proposed driver first acquires the current-voltage (I-V) data of the constant-current power MOSFETs and stores them into memories. These stored I-V data, along with a duty cycle control of the switching converter, are used to ensure that these power MOSFETs are operating in their linear region to minimize conduction power dissipation. The proposed circuit was verified using PSPICE with two to five LED strings. Simulation results show a maximum efficiency of 95.6%.
Keywords :
built-in self test; driver circuits; light emitting diodes; power MOSFET; LED strings; PSPICE; built-in self-test high-current LED driver; conduction power dissipation; constant-current controllers; constant-current power MOSFET; duty cycle control; efficiency 95.6 percent; high-current light-emitting-diode driver circuit; switching converter; Built-in self-test; Driver circuits; Light emitting diodes; MOSFETs; Power dissipation; Power supplies; Regulators; Switching converters; Topology; Voltage; Built-in Self-Test; LED driver;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
Type :
conf
DOI :
10.1109/ASICON.2009.5351429
Filename :
5351429
Link To Document :
بازگشت