Title :
The ESD protection improved by combining InGaN/GaN MQW LEDs with GaN Schottky diodes
Author :
Chen, C.H. ; Su, Y.K. ; Chang, S.J. ; Hung, H.
Author_Institution :
Dept. of Electron. Eng., Cheng-Shiu Inst. of Technol., Kaohsiung, Taiwan
Abstract :
GaN Schottky diodes were built internally inside the GaN green LEDs by using etching and re-deposition techniques. By proper selecting the etching areas underneath the bonding pads, one can minimize the optical loss due to the etching process. Although the reverse current and the forward turn-on voltage were both higher for the GaN LED with Schottky diode, it was found that the internal Schottky diode could significantly increase the ESD threshold from 450V to 1300V.
Keywords :
III-V semiconductors; Schottky diodes; electrostatic discharge; etching; gallium compounds; indium compounds; light emitting diodes; optical fabrication; optical losses; quantum well devices; wide band gap semiconductors; 450 to 1300 V; ESD protection; GaN Schottky diodes; InGaN; InGaN-GaN; MQW; bonding pads; etching; green LED; optical loss; re-deposition techniques; Bonding; Electrostatic discharge; Etching; Gallium nitride; Light emitting diodes; Optical losses; Protection; Quantum well devices; Schottky diodes; Threshold voltage;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
DOI :
10.1109/CLEOPR.2003.1274679