Title :
Reliability modeling method of electronic products considering failure mechanism dependence
Author :
Ying Chen ; Cui Ye ; Xiaoqin Zhang ; Rui Kang ; Dan Xue
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
There are varieties of failure mechanisms in electronic product, and they show a very strong dependence between each other. Understanding and describing the dependence of failure mechanism is the basis for product reliability prediction and assessment based on physics of failure. Starting from the characteristic of failure mechanism, this paper studies the classification of failure mechanism correlations, derives the mathematical model of reliability of each single failure mechanism correlation, and studies system reliability modeling method of electronic product considering failure mechanisms dependence based on reliability block diagram. Taking a voltage protection module as example, failure correlation between different components and dependence between mechanisms in one component are both discussed, their reliability models are built, and reliability parameters of the voltage protection module are obtained eventually.
Keywords :
electronic products; failure analysis; reliability; electronic products; failure correlation; failure mechanism correlation; failure mechanism dependence; mathematical model; product reliability prediction; reliability block diagram; system reliability modeling method; voltage protection module; Correlation; Failure analysis; Fatigue; Modeling; Reliability engineering; Vibrations;
Conference_Titel :
Cyber Technology in Automation, Control, and Intelligent Systems (CYBER), 2014 IEEE 4th Annual International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4799-3668-7
DOI :
10.1109/CYBER.2014.6917500