DocumentCode :
2652882
Title :
Dark-field infrared microscopy investigations of precipitates in bulk gallium arsenide
Author :
Brozel, M.R. ; Tüzemen, S.
Author_Institution :
Department of Electrical Engineering and Electronics and The Centre for Electronic Materials, UMIST, Manchester, UK
fYear :
1992
fDate :
21-24 Apr 1992
Firstpage :
217
Lastpage :
222
Keywords :
Gallium arsenide; Heat treatment; Laser beams; Light scattering; Optical scattering; Particle scattering; Rayleigh scattering; Surface emitting lasers; Tomography; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semi-Insulating III-V Materials, 1992 Proceedings of the 7th Conference on
Print_ISBN :
0-7503-0242-9
Type :
conf
DOI :
10.1109/SIM.1992.752702
Filename :
752702
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2652882
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