Title :
Clocked storage elements robust to process variations
Author :
Moon, Joosik ; Aktan, Mustafa ; Oklobdzija, Vojin G.
Author_Institution :
Univ. of Texas at Dallas, Richardson, TX, USA
Abstract :
In this work, different types of clocked storage elements are compared in terms of the impact of process variations on their performances. Transistor sizes are obtained from energy-efficient characteristics and used in the simulation to measure the delay variations caused by process variations. The structure of a clocked storage element affects its robustness to process variations.
Keywords :
clocks; transistor circuits; clocked storage elements; delay variations; energy-efficient characteristics; process variations; transistor sizes; Clocks; Degradation; Design methodology; Design optimization; Helium; Microelectronics; Multicore processing; Random access memory; Robustness; Timing; Clocked storage elements; energy-delay tradeoff; energy-efficient characteristics; process variations;
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
DOI :
10.1109/ASICON.2009.5351566
