• DocumentCode
    2655
  • Title

    A MultiScale Particle Filter Framework for Contour Detection

  • Author

    Widynski, Nicolas ; Mignotte, Max

  • Author_Institution
    Dept. of Comput. Sci. & Oper. Res. (DIRO), Univ. of Montreal, Montreal, QC, Canada
  • Volume
    36
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    1922
  • Lastpage
    1935
  • Abstract
    We investigate the contour detection task in complex natural images. We propose a novel contour detection algorithm which jointly tracks at two scales small pieces of edges called edgelets. This multiscale edgelet structure naturally embeds semi-local information and is the basic element of the proposed recursive Bayesian modeling. Prior and transition distributions are learned offline using a shape database. Likelihood functions are learned online, thus are adaptive to an image, and integrate color and gradient information via local, textural, oriented, and profile gradient-based features. The underlying model is estimated using a sequential Monte Carlo approach, and the final soft contour detection map is retrieved from the approximated trajectory distribution. We also propose to extend the model to the interactive cut-out task. Experiments conducted on the Berkeley Segmentation data sets show that the proposed MultiScale Particle Filter Contour Detector method performs well compared to competing state-of-the-art methods.
  • Keywords
    Bayes methods; Monte Carlo methods; image texture; particle filtering (numerical methods); Berkeley segmentation data sets; approximated trajectory distribution; color information; complex natural images; gradient information; interactive cut-out task; learned offline; likelihood functions; local gradient-based features; multiscale edgelet structure; multiscale particle filter framework; oriented gradient-based features; profile gradient-based features; recursive Bayesian modeling; semilocal information; sequential Monte Carlo approach; shape database; soft contour detection map; textural gradient-based features; Approximation methods; Detectors; Feature extraction; Image edge detection; Image segmentation; Lead; Shape; BSDS; Particle filtering; multiscale contour detection; sequential Monte Carlo methods; statistical model;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2014.2307856
  • Filename
    6747361