DocumentCode :
2655469
Title :
Three-dimensional Fresnel data inversion using MR-CSI algorithm
Author :
Li, M. ; Abubakar, Adamu ; van den Berg, P.M.
Author_Institution :
Schlumberger-Doll Res., Cambridge, MA, USA
fYear :
2009
fDate :
1-5 June 2009
Firstpage :
1
Lastpage :
4
Abstract :
In this paper we used a full vector three-dimensional (3D) multiplicative-regularized contrast source inversion (MR-CSI) method for inverting multi-frequency microwave scattered field data measured by the Institut Fresnel, Marseille, France. The 3D experimental setup consists of a transmitting and a receiving antenna. Twenty-one frequencies from 3 GHz to 8 GHz are used. The detailed setup of the apparatus and some initial tests can be found. The MR-CSI method had been applied to invert two dimensional data measured by the the Institut Fresnel. When reconstructing objects from these data, we carried out a ´blind´ inversion without explicitly taking into consideration any a priori information regarding the type of objects (either dielectric or metallic) to be reconstructed. The only a priori information which was used in the inversion is the positivity constraint on both permittivity and conductivity. By using such minimum a priori information the MR-CSI was proved to be able to invert these data sets accurately and within reasonable amount of time.
Keywords :
electromagnetic waves; inverse problems; permittivity; 3D multiplicative-regularized contrast source inversion method; conductivity; frequency 3 GHz to 8 GHz; full vector three-dimensional contrast source inversion; multifrequency microwave scattered field data; permittivity; receiving antenna; three-dimensional Fresnel data inversion; transmitting antenna; Antenna measurements; Dielectric measurements; Frequency; Microwave measurements; Microwave theory and techniques; Permittivity; Receiving antennas; Scattering; Testing; Transmitting antennas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
Conference_Location :
Charleston, SC
ISSN :
1522-3965
Print_ISBN :
978-1-4244-3647-7
Type :
conf
DOI :
10.1109/APS.2009.5172172
Filename :
5172172
Link To Document :
بازگشت