DocumentCode :
2657670
Title :
The microstructure of eutectic Au-Sn and In-Sn solders on Au/Ti and Au/Ni metallizations during laser solder bonding process for optical fiber alignment
Author :
Bohan, Yan ; Chunqing, Wang ; Wei, Zhang
Author_Institution :
Sch. of Mater. Sci. & Eng., Harbin Inst. of Technol.
fYear :
2006
fDate :
27-28 June 2006
Firstpage :
298
Lastpage :
303
Abstract :
In this work, two eutectic solders: 80Au20Sn and 52In48Sn were chosen for fiber bonding through laser soldering, and scanning electronic microscope (SEM) equipped with energy dispersive x-ray detector (EDX) was used to investigate the microstructures of at four interfaces between two solders and two metallizations: Au-Sn/(Au/Ti), Au-Sn/( Au/Ni), In-Sn/ (Au/Ti), In-Sn/(Au/Ni). Results show that as for the Au-Sn solder joint a large amount of zeta-phase was formed at the Au-Sn/(Au/Ti) interface with its morphology closely related with laser input energy; while at the Au-Sn/(Au/Ni) interface scallop-like (Au,Ni)Sn appeared with a low input energy and irregular-shaped (Au,Ni) 3Sn2 emerged with a high input energy. As for the In-Sn solder, the IMCs at the In-Sn/ (Au/Ti) interface transformed from a Au(In,Sn)2 layer to isolated Auln2 cubes with the increase of input energy while at the In-Sn/(Au/Ni) interface a thin layer of Au(In,Sn)2 was formed. As the connecting layer, Ti did not react in the soldering process
Keywords :
X-ray chemical analysis; eutectic alloys; eutectic structure; gold compounds; indium compounds; metallisation; scanning electron microscopy; solders; tin compounds; (AuNi)Sn; Au(InSn)2; Au-Ni; Au-Sn-Au-Ti; Au/Ni metallizations; Au/Ti metallizations; IMC; In-Sn-Au-Ti; energy dispersive x-ray detector; eutectic Au-Sn solders; eutectic In-Sn solders; fiber bonding; laser solder bonding; microstructure; optical fiber alignment; scanning electronic microscope; Bonding processes; Dispersion; Fiber lasers; Gold; Metallization; Microstructure; Optical fibers; Scanning electron microscopy; Soldering; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0488-6
Type :
conf
DOI :
10.1109/HDP.2006.1707610
Filename :
1707610
Link To Document :
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