DocumentCode :
2657711
Title :
Failure analysis of the CdZnTe detector electrode contacts
Author :
Jianyong, Teng ; Wenbin, Sang ; Kaifeng, Qin ; Jiahua, Min ; Jun, Xia
Author_Institution :
Shanghai Univ.
fYear :
2006
fDate :
27-28 June 2006
Firstpage :
308
Lastpage :
310
Abstract :
The characteristics of the Au contacts deposited by three different processes before and after accelerating aging tests have been investigated in this paper. The experimental results indicate that the aging tests can cause the degradation of the contact interfacial properties, such as continuities, adhesion strength and ohmic characteristics, especially for the contact interface deposited by the thermal vacuum processing, which would influence the performance of CdZnTe detectors
Keywords :
ageing; cadmium compounds; failure analysis; particle detectors; zinc compounds; CdZnTe; CdZnTe detector; aging tests; contact interfacial properties; degradation; electrode contacts; failure analysis; thermal vacuum processing; Accelerated aging; Acoustic transducers; Acoustic waves; Electrodes; Failure analysis; Gold; Radiation detectors; Surface acoustic waves; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0488-6
Type :
conf
DOI :
10.1109/HDP.2006.1707612
Filename :
1707612
Link To Document :
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