DocumentCode :
2657750
Title :
Very long-term frequency stability: estimation using a special-purpose statistic
Author :
Howe, D.A. ; Peppler, T.K.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2003
fDate :
4-8 May 2003
Firstpage :
233
Lastpage :
238
Abstract :
We introduce a statistic that can be used for a particularly difficult measurement problem, namely, determining frequency stability for frequency standards and oscillators for averaging times longer than those the traditional Allan deviation can estimate. Theoretical variance #1 ("Theol") has statistical properties that are like "Avar" (Allan variance), with two significant enhancements: (1) it can evaluate frequency stability at longer averaging times than given by the definition of Avar, and (2) it has the highest number of equivalent degrees of freedom (edf) of any estimator of frequency stability. Theol is unbiased relative to Avar for white FM noise, and only moderately biased for the other noises. Given measurements of the time-error function x(t) between two clocks, we have a sequence of time-error samples {xn : n=1,..., Nx] with a sampling period between adjacent observations given by τ0. In integer multiples of τ0, we can obtain an average of fractional-frequency deviates over time τ=mτ0, 1 ≤m≤Nx-1. Theol is given by Theol(m,T0, Nx)=1/0.75(Nx-m)(mT0)2 Nx-m/Σ/i=1/2-1/Σ/δ=0 1/(m/-δ)[xi-xi-δ+m/2)+(xi+m-xi=δ=m/2)]2, for m even, 10 ≤m≤ Nx-1, where frequency stability is evaluated at span or stride Ts=0.75mT0. This means that the last Ts=0.75(Nx-1)T0, or an averaging time corresponding to 3/4 of the duration of a data run, or 50 % longer than the longest T- value of Avar.
Keywords :
frequency stability; frequency standards; oscillators; sampling methods; time measurement; white noise; Allan deviation; degrees of freedom; frequency stability; frequency standards; oscillators; sampling period; statistical properties; time-error function; time-error samples; white FM noise; Clocks; Frequency estimation; Frequency measurement; Measurement standards; Oscillators; Particle measurements; Sampling methods; Stability; Statistics; White noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-7688-9
Type :
conf
DOI :
10.1109/FREQ.2003.1275095
Filename :
1275095
Link To Document :
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