DocumentCode :
2658510
Title :
Relative intensity noise study in the injection-locked integrated electroabsorption modulator-lasers
Author :
Jin, Xiaomin ; Tarng, Bennet Yun ; Chuang, Shun Lien
Author_Institution :
California Polytech. State Univ., San Luis Obispo
fYear :
2007
fDate :
12-14 Dec. 2007
Firstpage :
1
Lastpage :
2
Abstract :
Relative intensity noise (RIN), which represents the laser´s intrinsic resonance, is a very important property for semiconductor lasers. An electroabsorption modulator has commonly been developed monolithically with an integrated DFB laser to eliminate coupling. In this paper, we report new experimental results and theoretical calculations of RIN spectra of an injection-locked distributed feedback (DFB) laser using an integrated electroabsorption modulator-laser, which has a high reflection (HR) coating on the modulator side and an anti-reflection (AR) coating on the laser facet.
Keywords :
distributed feedback lasers; electroabsorption; optical modulation; semiconductor lasers; DFB laser; electroabsorption modulator-laser; injection-locked distributed feedback laser; relative intensity noise study; semiconductor laser; Coatings; Distributed feedback devices; Intensity modulation; Laser feedback; Laser noise; Laser theory; Optical coupling; Resonance; Semiconductor device noise; Semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2007 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4244-1892-3
Electronic_ISBN :
978-1-4244-1892-3
Type :
conf
DOI :
10.1109/ISDRS.2007.4422352
Filename :
4422352
Link To Document :
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