• DocumentCode
    2658528
  • Title

    DC conduction in epoxy based nano- and mesocomposites

  • Author

    Andritsch, Thomas ; Kochetov, Roman ; Morshuis, Peter H F ; Smit, Johan J.

  • Author_Institution
    Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2010
  • fDate
    17-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Various samples based on bisphenol-A type epoxy resin were prepared. Composites were produced containing various amounts of aluminum oxide, aluminum nitride and magnesium oxide, using ex-situ polymerization of surface functionalized particles. The average particle size of the used filler material ranged between 22 nm (magnesium oxide) and 60 nm (aluminum nitride). Synthesis of the samples is described in detail. The structure of these composites was thoroughly analyzed, using both scanning and transmission electron microscopy. A structural variance could be discerned due to the different filler loadings ranging from 0.5 to 5% per weight. The samples were divided into nano- and mesocomposites, according to the microscopic analysis results. Conduction current measurement was performed in a three-terminal cell by means of an electrometer. To obtain a clear view on the conduction mechanisms involved, dc poling field strengths between 1 and 5 kV/mm were applied. The changes of the dc conductivity in nanocomposites compared to the unfilled host material are shown.
  • Keywords
    alumina; aluminium compounds; dielectric polarisation; electrical conductivity; filled polymers; magnesium compounds; nanocomposites; nanofabrication; nanoparticles; particle size; polymerisation; resins; scanning electron microscopy; transmission electron microscopy; Al2O3; AlN; MgO; aluminum nitride; aluminum oxide; bisphenol-A type epoxy resin; conduction current measurement; dc conduction; dc poling field strengths; epoxy based mesocomposite; epoxy based nanocomposite; filler material; magnesium oxide; microscopic analysis; nanoparticles; particle size; polymerization; scanning electron microscopy; size 22 nm to 60 nm; surface functionalized particles; transmission electron microscopy; Aluminum oxide; Conductivity; Current density; Dielectrics; Nanocomposites; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
  • Conference_Location
    West Lafayette, IN
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-9468-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2010.5723965
  • Filename
    5723965