DocumentCode :
2658604
Title :
Noise figure vs. PM noise measurements: a study at microwave frequencies
Author :
Hati, A. ; Howe, D.A. ; Walls, F.L. ; Walker, D.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2003
fDate :
4-8 May 2003
Firstpage :
516
Lastpage :
520
Abstract :
This paper addresses two issues: (i) it compares the usefulness of phase-modulation (PM) noise measurements vs. noise figure (NF) measurements in characterizing the merit of an amplifier, and (ii) it reconciles a general misunderstanding in using -174 dBc/Hz (relative to carrier input power of 0 dBm) as thermal noise level. The residual broadband (white PM) noise is used as the basis for estimating the noise figure (NF) of an amplifier. We have observed experimentally that many amplifiers show an increase in the broadband noise of 1 to 5 dB as the signal level through the amplifier increases. This effect is linked to input power through the amplifier´s nonlinear intermodulation distortion. Consequently, this effect is reduced as linearity is increased. It is important to note that NF is sometimes used as a selection criteria for an amplifier but yields no information about potentially important close-to-carrier 1/f noise of an amplifier, whereas PM and amplitude modulation (AM) noise measurements do. We have verified theoretically and experimentally that the single-sideband PM (and AM) noise floor due to thermal noise is -177 dBc/Hz, relative to a carrier input power of 0 dBm.
Keywords :
III-V semiconductors; amplitude modulation; gallium arsenide; intermodulation distortion; microwave amplifiers; noise measurement; phase modulation; phase noise; semiconductor device models; semiconductor device noise; thermal noise; wideband amplifiers; 1 to 5 dB; GaAs; amplifier nonlinear intermodulation distortion; amplitude modulation; microwave frequencies; noise figure-PM noise measurements; phase modulation; residual broadband noise; single sideband PM noise floor; thermal noise level; Broadband amplifiers; Intermodulation distortion; Linearity; Microwave frequencies; Noise figure; Noise level; Noise measurement; Power amplifiers; Power measurement; White noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-7688-9
Type :
conf
DOI :
10.1109/FREQ.2003.1275144
Filename :
1275144
Link To Document :
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