Title :
Determination of Complex Dielectric and Magnetic Properties of Materials
Author :
Weisbrod, S. ; Morgan, L.A. ; Hughes, L.R.
Abstract :
The paper describes a modified Von Hippel technique for determination of complex dielectric and magnetic properties of materials. The technique uses least square fit to derive the scatter matrix parameters for calibrating out internal reflection between the sample and the reflection measuring equipment. Least square fit is also used to determine best values of mu and epsilon.
Keywords :
Dielectric materials; Equations; Joining processes; Least squares methods; Magnetic materials; Magnetic properties; Reflection; Scattering parameters; Transmission line matrix methods; Wavelength measurement;
Conference_Titel :
Microwave Symposium Digest, 1977 IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/MWSYM.1977.1124380
