DocumentCode :
2658856
Title :
Gate dielectric engineering of sub quarter micron AlGaN/GaN metal insulator semiconductor heterostructure field effect transistor (MISHFET) for high gain characteristics
Author :
Aggarwal, Ruchika ; Agrawal, Anju ; Gupta, Mridula ; Gupta, R.S.
Author_Institution :
Univ. of Delhi, New Delhi
fYear :
2007
fDate :
12-14 Dec. 2007
Firstpage :
1
Lastpage :
2
Abstract :
The gate dielectric engineering of MISHFET structure offers superior performance over conventional HFETs in terms of high power handling capacity as well as high gain characteristics. The closed form analytical model for different gate dielectric schemes has been formulated by taking into account the effect of nonlinear polarization, which plays very important effect in AlGaN/GaN material system. The electrical characteristics like drain current and transconductance are evaluated for different gate dielectric schemes and compared with uniform dielectric configuration.
Keywords :
III-V semiconductors; MISFET; aluminium compounds; dielectric polarisation; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; AlGaN-GaN; analytical model; drain current; gate dielectric engineering; metal insulator semiconductor heterostructure field effect transistor; nonlinear polarization effect; sub quarter micron MISHFET structure; transconductance; Aluminum gallium nitride; Analytical models; Dielectrics and electrical insulation; Gallium nitride; HEMTs; MODFETs; Metal-insulator structures; Performance gain; Polarization; Power engineering and energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2007 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4244-1892-3
Electronic_ISBN :
978-1-4244-1892-3
Type :
conf
DOI :
10.1109/ISDRS.2007.4422371
Filename :
4422371
Link To Document :
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