Title :
Computer-Controlled Infrared Microscope for Thermal Analysis of Microwave Transistors
Author :
Sechi, F.N. ; Perlman, B.S. ; Cusack, J.M.
Abstract :
A new technique for acquiring the temperature profile of microwave power transistors by infrared scanning has been developed. It provides for emissivity calibration using an infrared microscope interfaced with a computer.
Keywords :
Calibration; Infrared detectors; Microscopy; Microwave theory and techniques; Microwave transistors; Optical computing; Power transistors; Radiation detectors; Temperature measurement; Temperature sensors;
Conference_Titel :
Microwave Symposium Digest, 1977 IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/MWSYM.1977.1124387
