Title :
Investigation of effectiveness of split image plane for ESD immunity in system level
Author :
Lee, Yuang-Shung ; Chiang, Cheng-Hsiung
Author_Institution :
Dept. of Electron. Eng., Fu-Jen Catholic Univ., Taipei, Taiwan
Abstract :
In recently years, high speed digital circuit equipment and products with electrostatic discharge (ESD) issues have become crucial due to tighter rise time and smaller geometry spacing. A typical ESD trouble shooting case is discussed involving a personal computer system followed with plain analysis to confirm the ESD interference path in a complex system. Further analysis studies several printed circuit board (PCB) structure traces relative to crosstalk. The target ESD immunity is then increased up from ±4 kV to ±6 kV contact discharge for the margin design to ensure the improved effect using a novel technique in this evaluated system. The simulation result is verified to be in good agreement with the measurement result.
Keywords :
crosstalk; digital circuits; electrostatic discharge; microcomputers; printed circuits; reliability; ESD immunity; ESD interference; ESD trouble shooting; contact discharge; crosstalk; electrostatic discharge; high-speed digital circuit equipment; margin design; personal computer system; printed circuit board structure; split image plane; system level; Capacitance; Crosstalk; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic fields; Electrostatic discharge; Electrostatic interference; Immunity testing; Impedance; Mutual coupling;
Conference_Titel :
Telecommunications Energy Conference, 2009. INTELEC 2009. 31st International
Conference_Location :
Incheon
Print_ISBN :
978-1-4244-2490-0
Electronic_ISBN :
978-1-4244-2491-7
DOI :
10.1109/INTLEC.2009.5352011