DocumentCode
2661600
Title
Introducing Carrier Localisation in Total Internal Reflection Optical Switches to Restrict Carrier Diffusion in the Guiding Layer
Author
Thomson, D. ; Reed, G.T. ; Gardes, F.Y. ; Mashanovich, G.Z. ; Howe, S.
Author_Institution
Adv. Technol. Inst., Surrey Univ., Guildford
fYear
2006
fDate
13-15 Sept. 2006
Firstpage
78
Lastpage
80
Abstract
Previous total internal reflection based switches have suffered from the diffusion of carriers in the guiding layer leading to inefficient reflection and carrier injection. In our proposed device this problem is overcome by using a SiO2 barrier
Keywords
carrier lifetime; electro-optical switches; light reflection; optical films; optical waveguides; silicon compounds; SiO2; carrier diffusion; carrier injection; carrier localisation; carrier restrictive barrier; guiding layer; optical switches; optical waveguide; total internal reflection; Anodes; Cathodes; Doping; Optical propagation; Optical reflection; Optical switches; Optical waveguides; Region 10; Silicon; Slabs;
fLanguage
English
Publisher
ieee
Conference_Titel
Group IV Photonics, 2006. 3rd IEEE International Conference on
Conference_Location
Ottawa, Ont.
Print_ISBN
1-4244-0096-1
Type
conf
DOI
10.1109/GROUP4.2006.1708171
Filename
1708171
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