DocumentCode
2661996
Title
Notice of Retraction
Relationship between thickness of siliconized layer prepared by electrodeposition and components of molten salts
Author
Haili Yang ; Yuzhu Zhang ; Yungang Li ; Guozhang Tang ; Chong Cui
Author_Institution
Coll. of Mater. Sci. & Eng., Yanshan Univ., Qinhuangdao, China
Volume
5
fYear
2010
fDate
16-18 April 2010
Abstract
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
The siliconized layer on low silicon steel sheet was obtained by electrodeposition in KCl-NaCl-NaF-SiO2 molten salts. Proportion of molten salts was designed using symmetry-simplex method. A regression equation was found to be a better fit for the relationship between thickness of the siliconized layer and salts components. Based on the equation, the thickness isoline was plotted to reveal the influence of salts proportion on thickness. The results showed that NaF content had a significant effect on the thickness of the siliconized layer. The thickness increased gradually with the increase of NaF content. When NaF was 0.4-0.6 mole fraction, the thickness increased remarkably. Furthermore, when the concentration of KCl was kept constant, the ratio of NaF/NaCl was important to control the thickness. The thickness was relatively small as mole fraction ratio NaF/NaCl was about 2:3.
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
The siliconized layer on low silicon steel sheet was obtained by electrodeposition in KCl-NaCl-NaF-SiO2 molten salts. Proportion of molten salts was designed using symmetry-simplex method. A regression equation was found to be a better fit for the relationship between thickness of the siliconized layer and salts components. Based on the equation, the thickness isoline was plotted to reveal the influence of salts proportion on thickness. The results showed that NaF content had a significant effect on the thickness of the siliconized layer. The thickness increased gradually with the increase of NaF content. When NaF was 0.4-0.6 mole fraction, the thickness increased remarkably. Furthermore, when the concentration of KCl was kept constant, the ratio of NaF/NaCl was important to control the thickness. The thickness was relatively small as mole fraction ratio NaF/NaCl was about 2:3.
Keywords
electrodeposition; regression analysis; steel; FeCSiJk; electrodeposition; mole fraction ratio; molten salts; regression equation; silicon steel sheet; siliconized layer thickness; symmetry-simplex method; Annealing; Educational institutions; Equations; Kirchhoff´s Law; Materials science and technology; Optical microscopy; Power engineering and energy; Silicon; Steel; Thickness measurement; electrodeposition; molten salts; siliconized layer; symmetry-simplex; thickness;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-6347-3
Type
conf
DOI
10.1109/ICCET.2010.5486088
Filename
5486088
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