DocumentCode
266228
Title
Analysis of reliability and throughput under saturation condition of IEEE 802.15.6 CSMA/CA for wireless body area networks
Author
Sarkar, Subhadeep ; Misra, Sudip ; Chakraborty, Chandan ; Obaidat, Mohammad S.
Author_Institution
Sch. of Inf. Technol., Indian Inst. of Technol., Kharagpur, Kharagpur, India
fYear
2014
fDate
8-12 Dec. 2014
Firstpage
2405
Lastpage
2410
Abstract
The standardization of the IEEE 802.15.6 protocol for wireless body area networks (WBANs) dictates the physical layer and medium access control layer standards from the communication perspective. The standard supports short-range, extremely low power wireless communication with high quality of service and data rates upto 10 Mbps in the vicinity of any living tissue. In this paper, we develop a discrete-time Markov model for the accurate analysis of reliability and throughput of an IEEE 802.15.6 CSMA/CA-based WBAN under saturation condition. Existing literature on Markov chain-based analysis of IEEE 802.15.6, however, do not take into consideration the time a node spends waiting for the immediate acknowledgement frame after transmission of a packet, until time-out occurs. In this work, we take into consideration the waiting time for a node after its transmission, and accordingly modified the structure of the discrete-time Markov chain (DTMC). We also show that as the payload length increases, the reliability of a node decreases; whereas its throughput sharply increases.
Keywords
Markov processes; access protocols; body area networks; carrier sense multiple access; quality of service; telecommunication network reliability; DTMC; IEEE 802.15.6 CSMA/CA saturation condition; IEEE 802.15.6 protocol standardization; WBAN; discrete-time Markov chain; medium access control layer; packet transmission; power wireless communication; quality of service; reliability analysis; throughput analysis; wireless body area network; Equations; IEEE 802.15 Standards; Markov processes; Radiation detectors; Reliability; Throughput; IEEE 802.15.6; Markov model; Reliability; Throughput; WBAN;
fLanguage
English
Publisher
ieee
Conference_Titel
Global Communications Conference (GLOBECOM), 2014 IEEE
Conference_Location
Austin, TX
Type
conf
DOI
10.1109/GLOCOM.2014.7037168
Filename
7037168
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