Title :
Fault tolerance analysis of MEMS holographic memory for DORGAs
Author :
Seto, Daisaku ; Watanabe, Minoru
Author_Institution :
Electr. & Electron. Eng., Shizuoka Univ., Shizuoka, Japan
Abstract :
Demand for fast dynamic reconfiguration has increased since dynamic reconfiguration can accelerate the performance of implementation circuits on its programmable gate array. Such dynamic reconfiguration is dependent upon two important features: fast reconfiguration and numerous contexts. However, fast reconfiguration and numerous contexts share a tradeoff relation on current VLSIs. Therefore, optically reconfigurable gate arrays (ORGAs) have been developed to resolve this dilemma. Among studies of such devices, this paper presents a demonstration of a dynamic ORGA (DORGA) with a MEMS holographic memory and its fault tolerance analysis results.
Keywords :
VLSI; fault tolerant computing; holographic storage; programmable logic arrays; reconfigurable architectures; DORGA; MEMS holographic memory; VLSI; dynamic optically reconfigurable gate arrays; fault tolerance analysis; programmable gate array; Circuits; Fault tolerance; Holographic optical components; Holography; Micromechanical devices; Mirrors; Optical arrays; Optical devices; Photodiodes; Semiconductor laser arrays;
Conference_Titel :
Micro-NanoMechatronics and Human Science, 2009. MHS 2009. International Symposium on
Conference_Location :
Nagoya
Print_ISBN :
978-1-4244-5094-7
Electronic_ISBN :
978-1-4244-5095-4
DOI :
10.1109/MHS.2009.5352102
