DocumentCode :
2663394
Title :
DSC-a space compression method
Author :
Jone, Wen-Ben
Author_Institution :
Dept. of Comput. Sci., New Mexico Inst. of Min. & Technol., Socorro, NM, USA
fYear :
1990
fDate :
1-3 May 1990
Firstpage :
2756
Abstract :
A dynamic space-compression method called DSC is proposed. The basic idea of DSC is to construct the compression circuits by dynamically estimating error probabilities of the outputs. Experimental results demonstrate that DSC is very efficient. The theory to predict the performance of general space compression methods is developed and is verified by computer simulation results
Keywords :
built-in self test; digital integrated circuits; integrated circuit testing; logic testing; BIST; DSC; computer simulation results; dynamic space-compression method; dynamically estimating error probabilities; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computer science; Electrical fault detection; Error probability; Fault detection; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location :
New Orleans, LA
Type :
conf
DOI :
10.1109/ISCAS.1990.112580
Filename :
112580
Link To Document :
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