Title :
Mcm-L Technologies: Myths and Experiences in Multiple Product Scenarios
Author :
Carey, David ; Hashemi, Hassan ; Hunter, Paul
Author_Institution :
Microelectronics and Computer Technology Corporation (MCC), Texas
Keywords :
Application software; Bonding; Circuit testing; Costs; Integrated circuit interconnections; Multichip modules; Packaging; Printed circuits; Space technology; Workstations;
Conference_Titel :
Multichip Modules, 1994. Proceedings of the 1994 International Conference on
Print_ISBN :
0-930815-39-4
DOI :
10.1109/ICMCM.1994.753584