Abstract :
The following topics are dealt with:IC physical design; circuit design;SOC, NOC, and application design;fault tolerance & failure analysis;FPGA & reconfigurable computing; test generation, BIST, and memory testing;emerging technology & formal verification.
Keywords :
built-in self test; failure analysis; fault tolerance; field programmable gate arrays; formal verification; integrated circuit design; network-on-chip; BIST; FPGA; Formal Verification; Generation, Test; IC physical design; NOC; SOC; application design; circuit design; failure analysis; fault tolerance; memory testing; reconfigurable computing;
